CD-SEM, the workhorse metrology tool used by fabs for process control, is facing big challenges at 5nm and below. Traditionally, CD-SEM imaging has relied on a limited number of image frames for ...
Scanning electron microscopy images of fibers from engineered spider silk. To validate their computational findings, the Northwestern team used spectroscopy techniques to examine how the protein ...
SEM stands for scanning electron microscope. The SEM is a microscope that uses electrons instead of light to form an image. Since their development in the early 1950's, scanning electron microscopes ...
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