Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...
Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...
October 13, 2014. TEGAM Inc., a supplier of micro-ohmmeters, has just introduced five new Kelvin probes. When used with TEGAM's R1L bond meters or the 1740 or 1750 micro-ohmeters, they enable ...
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